The Larkin Power Components Power Semiconductor Tester – Model M3K is designed to perform testing of power semiconductors, such as, SCRs/Thyristors, Diodes, IGBTs, Transistors, and most MOS FETs.
The Cathode (Emitter) of the device under test is operated near ground potential.
The Larkin Power Components Power Semiconductor Tester – Model M3K performs three tests:
• PFV (Peak Forward Voltage)
• PRV (Peak Reverse Voltage)
• Gate Voltage and Current to trigger (Base Current for Transistors)
The test circuits are of the type recommended by the JEDEC test standards RS397. The PRV/PFV tests applies a PEAK REVERSE VOLTAGE or PEAK FORWARD VOLTAGE, half wave 60 Hertz wave form to the device and the resulting peak leakage current is measured by a peak storage circuit and displayed on a peak reading ammeter.
The E/I curve of the device can be displayed on an X/Y oscilloscope. The DC Gate test is used to measure the DC gate voltage and current required to trigger the device into its On-state. The Anode (Collector) supply is half wave 60 Hertz wave form.
The Larkin M3K provides a Gate Voltage high enough to test for turn-on of IGBTs and MOS FETs. Both NPN and PNP bipolar transistors can be tested.
Protec offers multiple locations to better serve your needs, and electrical testing equipment rental options that work for you.
